The Challenges of 65nm Process


The Challenges of 65nm Process
ISBN 978-1-55424-001-2
Published February 2007
© 2007 Semiconductor Insights

The challenges of designing at 65nm are significant and clearly account for why it has taken the better part of a year for companies to release devices. Increasingly restrictive design rules are required to ensure adequate yields. Process variations are magnified by increasingly smaller features.

Our special edition publication,
"The Challenges of 65nm Process" (ISBN 978-1-55424-001-2) looks at these challenges, and examines five advanced 65nm devices from Xilinx, Texas Instruments, Intel and Advanced Micro Devices (AMD).

Complete the form below to receive a complimentary copy.


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